System-on-Chip Test Architectures (Systems on Silicon)
Laung-Terng Wang, Charles E. Stroud, Nur A. Touba, “System-on-Chip Test Architectures (Systems on Silicon)”
Publisher: Morgan Kaufmann | Pages: 896 | Date: 2007-11-16 | ISBN: 012373973X | PDF | 8.77 Mb
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm [...]